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HIOKI Probe Testers
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altKey Features

Flying Probe ICT with AOI Functions
* Evaluates solder joints between lands and leads by resistance testing
* 40 steps/sec. measuring rate
* AOI function checks component presence, polarity and displacement
* Soft-landing probes to prevent board damage
* Minimum probing pitch of 0.2mm
* Fast fixture-less setup
*Optional Tecnomatix Unicam CAD conversion software


1220 Bed-of-Nails (BON) In-Circuit Tester

* High-speed and efficient in-circuit testing
* Automatic Test Generation (ATG) function
* Remote self-diagnostic feature
* Data stored in CSV format for off-line analysis
* Wide range measurement capabilities
* Compact, space-saving footprint
* User-friendly Windows® 2000/XP operation


1220 Benchtop Model

* Flexible and cost-effective
* Adaptable to third-party BON fixtures


 
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